• 注册
  • 可靠性试验 可靠性试验 关注:680 内容:3524

    Dell Lead free Qualification

  • 查看作者
  • 打赏作者
  • 当前位置: 可靠性论坛 > 可靠性技术 > 可靠性试验 > 正文
  • 1
  • 可靠性试验
  • 下载地址:[url=http://www.testres.com/viewthread.php?tid=124&extra=page%3D1]DellLeadfreeQualification[/url]
    [size=5][color=#000000]2.0Introduction
    [size=5][color=#000000]2.1Purpose/Objective
    [size=5][color=#000000][size=11pt][color=#000000][font=TimesNewRoman]ThisdocumentdetailsDellCorporation’srequirementsforqualificationoflead-freeprintedcircuitboardassemblies(PCBAs)supplieddirectlyorindirectlytoDellforuseinDellbrandedproducts.
    Theserequirementsaresubjecttochangebasedonfurtherindustrystudyandtechnologicalchangesrelatingtolead-freesoldersandparts.

    [size=11pt][font=TimesNewRoman][color=#000000]
    [size=11pt][color=#000000][font=TimesNewRoman]ThisqualificationrequirementsdocumentistobeusedinconjunctionwithDellP/ND4394GeneralSpecificationforAllowableLevelsofLead(Pb)inDellProductsandDellP/NM4461whichprovidesPb-freerequirementsforindividualcomponentsusedinDellproducts.
    [size=5][color=#000000]2.2Scope
    [size=5][color=#000000][size=11pt][color=#000000][font=TimesNewRoman]Therequirementslistedinthisdocumentcoverlead-freealloyssuchasSnCu,SnAgorSnAgCu,withliquidustemperaturesbelow227°C.ExemptionstoPb-freesolderareallowedinDellproductsaccordingtothelatestRoHSdirectives(orasdeterminedbyDell’sEnvironmentalgroup).
    [u]TheDellpreferredPb-freealloyisSnAgCuinthecompositionrangeSn(3.0-4.0)Ag(0.5-0.9)Cu.[/u]Lead-freesolderalloyswithmeltingtemperaturegreaterthan227°Corthosecontaining[u]Bi,In,orZnareunacceptable[/u]atthistimeduetoreliability,supply,andorcorrosionconcerns.
    PreferredcomponentleadfinishismatteSnover1.3µmNi,howeverothersareacceptableifSnwhiskerriskismitigated.
    PreferredboardfinishisimmersionAg(0.15-0.5µmthick).Howeverothersurfacefinisheswillalsobeacceptableincertainapplications(i.e.Ni/Auplated,hightemperatureratedOSPmaterials,immersionSn,etc.).

    [size=5][color=#000000]2.3SupportingDocuments
    [list][*][font=TimesNewRoman][size=11pt]AgileaccessibleviatheValueChainwebsite([size=11pt][url=https://valuechain.dell.com/][color=#0000ff] 链接[/url][color=#000000])forSuppliers/Vendors.[*][color=#000000][font=TimesNewRoman][size=11pt]GeneralSpecificationforAllowableLevelsofLead(Pb)inDellProducts(DellP/ND4394)locatedinAgile.[size=11pt][*][color=#000000][font=TimesNewRoman][size=11pt]LeadFreeComponentRequirements(DellP/NM4461)locatedinAgile.[size=11pt][*][font=TimesNewRoman][size=11pt]DellRestrictedMaterialSpec(DellP/N6T198)locatedinAgile.[size=11pt][*][font=TimesNewRoman][size=11pt]DellSupplierDeclarationonRestrictedorBannedMaterials(DellP/N7X435)locatedinAgile.[size=11pt][*][size=11pt][color=#000000][font=TimesNewRoman]DirectiveoftheEuropeanParliamentandoftheCouncilontheRestrictionoftheUseofCertainHazardousSubstancesinElectricalandElectronicEquipment,2000/159/COD,October2002.(RoHSDirective)[*][size=11pt][font=TimesNewRoman][color=#000000]DirectiveoftheEuropeanParliamentandoftheCouncilonWasteElectricalandElectronicEquipment,2000/0158/COD,October2002.(WEEEDirective)[*][size=11pt][color=#000000][font=TimesNewRoman]91/157/EECasamendedbyDirective98/101/EC,Batteriesandaccumulatorscontainingcertaindangeroussubstances.[/list][size=5][color=#000000]2.4Procedure
    [size=5][color=#000000][size=11pt][color=#000000][font=TimesNewRoman]PriortothestartofqualificationtestingitisexpectedthatthesupplierhasperformedextensiveprocessoptimizationstudiesforPb-free.
    DOEsshouldhavebeenruntoselectthebestsolderpastematerialforscreenprintingandsolderjointintegrity.
    Optimumreflowparametersandanacceptableprocesswindowshouldbedetermined.
    Necessarywavesolderandreworkproceduresshouldbefinalizedandinspectionmethodsdetermined.
    Itisexpectedthattheprocessconditionsandmaterialsusedtobuildproductsforqualificationarelocked-infortheforeseeablefuture.

    [size=11pt][font=TimesNewRoman][color=#000000]
    [size=11pt][color=#000000][font=TimesNewRoman]Thisqualificationdocumentconsistsofthreelevelsoftestingrequirements.
    Thequalificationlevelisbasedonproductcomplexity,reliabilityexpectationsandrisktocustomers.

    TheLevel1requirementsapplytorelativelysimpleDellcomponents/productswithalowerimpliedriskoffailureduetolead-freematerialsandprocessing.
    Level2appliestoproductswithmoderatecomplexityandriskoffailurewhileLevel3ismeanttoaddressmorecomplexDellproductswithhighestexpectedreliability.
    [u]Priortoinitiationoftesting,thesuppliershallobtainwrittenconfirmationfromDelloftherequiredqualificationlevelrequiredfortheirproduct.[/u]
    [font=TimesNewRoman][size=3][color=#000000]
    [size=11pt][color=#000000][font=TimesNewRoman]Priortoanytestingadetailedtestplanshouldbedevelopedandagreeduponbyallinvolvedparties.
    Thisplanshouldincludespecifictests,testinglocation,samplesizes,pass/failcriteria,etc.
    SamplesizesforcomponentleveltestingandevaluationwillbeaccordingtospecificationunlessspecificallymodifiedbyDell.
    ReliabilityevaluationwillbeperformedataDellapprovedtestsiteunlessotherwiseagreedpriortostartoftheproject.
    [size=11pt][font=TimesNewRoman][color=#000000]
    [size=11pt][color=#000000][font=TimesNewRoman]AcontrolgroupwillberequiredforcomparisonpurposesandmayconsistofthesameproductassembledwithSnPbsolderorapreviousgenerationofSnPbproductofsamecomplexity.
    ControlgrouptypewillbedeterminedbymutualagreementbetweenDellandthesupplier.
    [size=11pt][font=TimesNewRoman][color=#000000]
    [size=11pt][color=#000000][font=TimesNewRoman]Thequalificationcriterialistedare[u]inaddition[/u]tostandardqualificationtestingalreadyexpectedofthesupplierandanyusedbythesuppliertoqualifytheircurrentprocesses.
    Eachsupplierisrequiredtosubmitareportdetailingthetestconditions,samplesizes,evaluationproceduresandtestresultsforanytestingthatwasperformedseparatelyfromDellrequirement.

    [u][size=11pt][font=TimesNewRoman][color=#000000][/u]
    [u][size=11pt][font=TimesNewRoman][color=#000000]AtDelldiscretion,basedoncoverageoftestingalreadyperformedandresultsprovided,allorpartoftherequirementsinthisdocumentmaybemodified.
    InsomecasesDellmayrequireadditionaltestingtodeterminetestlimitsandfailuremechanismsassociatedwithcertainhigherriskcomponents.[/u]
    [size=5][color=#000000][size=5][color=#000000]3.0QualificationRequirementsforLevel1
    [size=5][color=#000000][size=11pt][color=#000000][font=TimesNewRoman]Thislevelisreservedforproductswithlowerperceivedriskoffailureduetointroductionoflead-freematerialsandprocessing.
    Productsdeterminedtobeinthislevelarerelativelysimpleandconstructedexclusivelywithcomponentssuchaspassives,through-holeand/orcoarsepitch(>0.5mm)surfacemountleadedpackages.[u]Someexceptionsmayapplybasedonspecificproductapplicationoruseenvironment.[/u]
    Toensurethatallmaterialscansurvivetheelevatedtemperaturesexpectedwithleadfreeassembly,allcomponentsmustbeevaluatedindividuallypriortoassembly.
    Typesoffailuremechanismsbeingscreenedforincludeheatdamage,moistureinducedcracking/delamination,poorsolderability,andweakjoints.

    [[i]本帖最后由cliffcrag于2007-9-2910:08编辑[/i]]

    请登录之后再进行评论

    登录
  • 可靠性工程软件ReliaSoft中国总代理上海山外山机电
  • 江苏拓米洛高端装备股份有限公司
  • 发布内容
  • 做任务
  • 动态
  • 风格
  • 到底部
  • 帖子间隔 侧栏位置: