随便翻到的电子器件Handbook KIOXIA

随便翻到的电子器件Handbookm全英文版本

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Chapter 1 Semiconductor Reliability 

1-1. Reliability Concept …………………………………………………………………….9 

1-1-1. Defining and Quantifying Reliability …………………………………………9 

1-1-2. Reliability and Time ………………………………………………………………10 

1-1-2-1. Reliability (or Reliability Function) R(t) 

1-1-2-2. Non-Reliability (or Cumulative Failure Distribution) F(t) 

1-1-2-3. Failure Density Function ƒ(t) 

1-1-2-4. (Instantaneous) Failure Rate (or Hazard Rate) (t) 

1-1-2-5. Product Life

1-1-2-6. Distributions in Reliability Analysis 

1-1-2-7. Continuous Distributions 

1-1-2-8. Discrete Distributions 

1-1-2-9. Bathtub Curve 

1-1-2-10. Concept of Initial Failure Period’s Screening 

1-1-2-11. System LSI Field Failure Mode 

1-1-3. Operating and Environment Conditions ……………………………………28 

1-1-4. Designing Against External Stress ………………………………………….29

1-2. Factors Affecting Reliability ………………………………………………………..30 

Chapter 2 Failure Mechanisms ………………………………………………………..43

Chapter 3 Reliability Testing ………………………………………………………102

Chapter 4 Failure Analysis ……………………………………………………………..136

Chapter 5 Mathematics of Reliability ….…………………………………………176